X-Git-Url: http://git.rot13.org/?p=goodfet;a=blobdiff_plain;f=firmware%2Finclude%2Fjtagxscale.h;h=0f85b0abfc27d1bebccd9cffb3184f07327759c4;hp=f1f17fa9401ceb1e79156d70c00d56d31f9ab6b6;hb=a031b4a563978102c664466d1e91a9c3ab0553dd;hpb=278a9487e60fdcf3e96236580f9542c218a8c1f1

diff --git a/firmware/include/jtagxscale.h b/firmware/include/jtagxscale.h
index f1f17fa..0f85b0a 100644
--- a/firmware/include/jtagxscale.h
+++ b/firmware/include/jtagxscale.h
@@ -7,22 +7,12 @@
 /* NOTE: I heavily cribbed from the ARM7TDMI jtag implementation. Credit where
  * credit is due. */
 
-/* 
- * Utility Macros 
- */
-
-/* XTT (LED TCK TOCK) toggles the CLK line while turning on/off the LED */
-#define XTT             CLRTCK;PLEDOUT^=PLEDPIN;SETTCK;PLEDOUT^=PLEDPIN;
-
-/* RUN_TEST_IDLE gets us into run-test-idle from anywhere in the TAP FSM */
-#define RUN_TEST_IDLE   SETTMS;XTT;XTT;XTT;XTT;XTT;XTT;XTT;XTT;CLRTMS;XTT;
+#ifndef JTAGXSCALE_H
+#define JTAGXSCALE_H
 
-/* SHIFT_IR gets us into the "Shift IR" state from the run-test-idle state */
-#define SHIFT_IR        SETTMS;XTT;XTT;CLRTMS;XTT;XTT;
-
-/* SHIFT_DIR gets us into the "Shift DR" state from the run-test-idle state */
-#define SHIFT_DR        SETTMS;XTT;CLRTMS;XTT;XTT;
+#include "app.h"
 
+#define JTAGXSCALE 0x15
 
 /*
  * XScale 5-bit JTAG Commands
@@ -38,7 +28,7 @@
  * between TDI and TDO. This register can be accessed via the JTAG Test-Access 
  * Port throughout the device operation. Access to the Bypass register can also 
  * be obtained with the bypass instruction. */
-#define XSCALE_IR_HIGHZ             0x08
+#define XSCALE_IR_HIGHZ				0x08
 
 /* 11110 - Get ID Code
  * The idcode instruction is used in conjunction with the device identification 
@@ -47,7 +37,7 @@
  * identification code (32 bits) on TDO into the identification register on the 
  * rising edge of TCK in the Capture_DR state. Note: The device identification 
  * register is not altered by data being shifted in on TDI.*/
-#define XSCALE_IR_IDCODE            0x1E
+#define XSCALE_IR_IDCODE			0x1E
 
 /* 11111 - Bypass
  * The bypass instruction selects the Bypass register between TDI and TDO pins 
@@ -56,14 +46,12 @@
  * all other test data registers have no effect on the operation of the system. 
  * Test data registers with both test and system functionality perform their 
  * system functions when this instruction is selected. */
-#define XSCALE_IR_BYPASS            0x1F
+#define XSCALE_IR_BYPASS			0x1F
 
 /*
  * GoodFET Commands from the Client
  */
-
-/* Get CHIP ID */
-#define XSCALE_GET_CHIP_ID          0xF1
+/* commands start at 0xF0 */
 
 
 /*
@@ -77,8 +65,7 @@ unsigned long jtag_xscale_shift_n(unsigned long word,
                                   unsigned char nbits,
                                   unsigned char flags);
 
-/* this handles shifting in the IDCODE instruction and shifting the result
- * out the TDO and return it. */
-unsigned long jtag_xscale_idcode();
+extern app_t const jtagxscale_app;
 
+#endif // JTAGXSCALE_H